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The Energy Dispersive X-ray Analyser, from EDAX, has a particularly good geometry (take-off angle is 35 o) and a modern software system with extensive mapping and image manipulation. The Electron Backscatter Diffraction system is from TSL, and allows very precise measurements of crystal orientation, texture, etc. EDAX's EDS, EBSD, WDS and Micro-XRF microanalysis products can help solve materials characterization problems across an array of markets and applications.